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Semiconductor silicon wafer under test on the probe station. Selective focus.

RFID:2FMRPH5

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Contributor:

genkur / Alamy Stock Photo

Image ID:

2FMRPH5

File size:

53.8 MB (838.3 KB Compressed download)

Releases:

Model - no | Property - noDo I need a release?

Dimensions:

5313 x 3542 px | 45 x 30 cm | 17.7 x 11.8 inches | 300dpi

Date taken:

14 April 2021

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Semiconductor silicon wafer under test on the probe station. Selective focus.

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